Announcing a Special Issue of the
IEEE Transactions on Plasma Science
on High-Power X-Ray Flash Radiography Sources
(Scheduled for April 2009)

High-power x-ray flash radiography has proven to be a very important diagnostic tool in several areas where penetration through dense material, the ability to image small-scale features, and an interrogating-pulse duration that is short compared with the time scale of the experiment are required.  A variety of application-specific, X-ray-based radiographic systems have been developed to, e.g., image projectiles in motion, investigate aspects of explosives and explosively driven systems, aid in understanding the physics of high-atomic-number z pinches, and characterize the behavior of dense matter under extreme conditions.  Because of the wide variety of applications for high-power x-ray flash radiography, research in this area comprises a spectrum of scientific disciplines and supporting technologies including: pulsed-power science and technology, particle-accelerator science and technology, high-power electron-beam-diode physics, high-energy particle-beam dynamics and control, laser technology, laser-target interactions, and x-ray interaction with material.  A variety of computational tools, including particle-in-cell and Monte-Carlo-transport codes have proven to be of great value in this area of research.  Diagnostics for flash-radiography systems are also essential for making progress.  This special issue will provide a mechanism for researchers in this field to discuss some of the more fundamental aspects of radiographic systems and their components, as well as computational tools and diagnostics for understanding and characterizing flash radiographic sources.

Contributions will address aspects of radiographic systems including, but not limited to:

• Radiographic sources (e.g., electron-beam diodes and other bremsstrahlung converters, x-pinches, laser sources)
• Drivers (e.g., accelerators, pulsed-power systems, lasers)
• Power flow in radiographic systems
• Complete systems
• Diagnostics for flash x-ray radiography

Emphasis will be placed on experimental results, analytical theory and analyses, and computational analyses that contribute to the physics understanding of radiographic systems and their components.  All contributions should be submitted electronically through the IEEE Manuscript Central web site at:
http://tps-ieee.manuscriptcentral.com.

Submissions are Due 1 September 2008